Targeting Conditional Operations in Sequential Test Pattern Generation

The goal of the paper is to propose a set of dedicated fault models targeting single stuck-at faults in hierarchical designs. These include hierarchical fault model for Functional Units, a functional model for multiplexers and a combined hierarchical-functional fault model for conditional operations. In the paper, the new fault models have been integrated to a high-level test path activation tool DECIDER. As comparative experiments show, extremely high fault coverages are achieved for sequential benchmarks with short run times.